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SPIE Photomask Technology is a global forum for scientists, engineers, and industry leaders to present and discuss key topics related to photomasks design, fabrication, quality control, and use in the semiconductor industry. EUV lithography is being driven into HVM manufacturing, 193nm lithography tolerances are increasingly tight to enable multiple patterning solutions, and it is imperative to enhance productivity in mask manufacturing excellence and integration into the wafer fab operations and lithographic optimization. To support continued advancement, research continues to develop new mask materials, inspection methods as well as in preparation of high-NA EUV lithography.
All Registered Trademarks, brand names and logos are respected and their ownership acknowledged. They are used on this website for information and reference purposes only. Test Interest doesn't assume any other implication or representation.